In-Situ SEM & AFM Systems
Angstrom Scientific offers a wide range of in-situ systems for SEM including ConnectomX Katana microtome for sample sectioning, NenoVision AFM for atomic force microscopy integration, C-sense Self-Sensing Cantilevers, and Alemnis micro and nano mechanical test systems. These solutions enable real-time characterization and testing within the SEM environment. Ideal for nanotechnology, materials science, and semiconductor research applications requiring correlative microscopy and in-situ analysis.
| Short Description | In-situ SEM and AFM solutions including microtomes, AFM, and nano-mechanical test systems |
|---|---|
| SKU | AS-INSITU-2767 |
| MOQ | 1 Piece |
| Supply Ability | Available for order, custom configurations available |
| Delivery Time | 4-8 weeks depending on configuration |
| Port | Various US ports |
| Payment Terms | Negotiable |
| Delivery Time | 4-8 weeks depending on configuration |
|---|---|
| Port | Various US ports |
| Payment Terms | Negotiable |
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