Angstrom Scientific Inc. represents leading manufacturers supporting materials characterization. Founders Evan Slow and Bob Sommerville formed Angstrom Scientific in 2004, to focus on providing characterization solutions to nanotechnology researchers. As a distributor and manufacturer's representative serving the Americas, Angstrom Scientific utilizes Evan and Bob's combined 50+ years of experience in scientific equipment applications to help customers acquire the instrumentation that is best suited to their needs. Our portfolio includes sample prep tools from Leica (ultra-microtomes and e-beam coaters), Hitachi Tabletop TM4000P Ser 3 SEM with EDX and FlexSEM1000 II, in-situ SEM systems from ConnectomX, NenoVision, C-sense, and Alemnis, semiconductor failure analysis systems from Imina and Point Electronic, TEM solutions from EMSIS, portable robotic X-ray & CT systems from Radalytica, and micro positioning stages from VacuumFAB. We serve the nanotechnology, materials science, semiconductor, and research communities across the Americas.