Semiconductor & TEM Solutions
Angstrom Scientific provides advanced semiconductor and TEM solutions including Imina probe systems coupled with Point Electronic EBIC/EBAC for semiconductor failure analysis, Point Electronic SEM modernization and STEBIC systems, EMSIS cameras for TEM imaging, and Radalytica portable robotic X-ray & CT systems. Additional solutions include VacuumFAB micro positioning stages and switches. These systems enable comprehensive materials characterization, failure analysis, and quality control for semiconductor, nanotechnology, and materials science applications.
| Short Description | Imina probe systems, Point Electronic EBIC/EBAC, EMSIS TEM cameras, and Radalytica CT systems |
|---|---|
| SKU | AS-SEMI-2767 |
| MOQ | 1 Piece |
| Supply Ability | Available for order, custom configurations available |
| Delivery Time | 6-12 weeks depending on configuration |
| Port | Various US ports |
| Payment Terms | Negotiable |
| Delivery Time | 6-12 weeks depending on configuration |
|---|---|
| Port | Various US ports |
| Payment Terms | Negotiable |
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